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1. product profile 1.1 general description 400 w ldmos power transistor with improved video bandwidth for base station applications at frequencies from 1805 mhz to 1995 mhz. [1] test signal: 3gpp test model 1; 64 dpch; par = 7.5 db at 0.01 % probability on ccdf; carrier spacing = 5 mhz; f 1 = 1807.5 mhz; f 2 = 1812.5 mhz; f 3 = 1872.5 mhz; f 4 = 1877.5 mhz. 1.2 features and benefits ? decoupling leads to enable improved video bandwidth (vbw) (120 mhz typical) ? high efficiency ? low r th providing excellent thermal stability ? designed for broadband operation ? lower output capacitance for improved performance in doherty applications ? designed for low memory effects prov iding excellent pre-distortability ? internally matched for ease of use ? integrated esd protection ? design optimized for gull-wing ? excellent ruggedness ? compliant to directive 2002/ 95/ec, regarding restriction of hazardous substances (rohs) 1.3 applications ? rf power amplifiers for base stations and multi carrier applications in the 1805 mhz to 1995 mhz frequency range blf8g20ls-400pv; BLF8G20LS-400PGV power ldmos transistor rev. 1 ? 25 june 2013 product data sheet table 1. typical performance typical rf performance at t case = 25 ? c in a common source class-ab pr oduction test circuit, tested on straight lead device. test signal f i dq v ds p l(av) g p ? d acpr 5m (mhz) (ma) (v) (w) (db) (%) (dbc) 2-carrier w-cdma 1805 to 1995 3400 28 95 19 28 ? 33 [1]
blf8g20ls-400pv_ls-400pgv all information provided in this document is subject to legal disclaimers. ? nxp b.v. 2013. all rights reserved. product data sheet rev. 1 ? 25 june 2013 2 of 20 nxp semiconductors blf8g20ls-400p(g)v power ldmos transistor 2. pinning information [1] connected to flange. 3. ordering information table 2. pinning pin description simplified outline graphic symbol blf8g20ls-400pv (sot1242b) 1drain1 2drain2 3gate1 4gate2 5source [1] 6 decoupling1 7 decoupling2 8n . c . 9n . c . BLF8G20LS-400PGV (sot1242c) 1d r a i n 1 2d r a i n 2 3g a t e 1 4g a t e 2 5s o u r c e [1] 6 decoupling1 7 decoupling2 8n . c . 9n . c . d d d d d d table 3. ordering information type number package name description version blf8g20ls-400pv - earless flanged ceramic package; 8 leads sot1242b BLF8G20LS-400PGV - earless flanged ceramic package; 8 leads sot1242c blf8g20ls-400pv_ls-400pgv all information provided in this document is subject to legal disclaimers. ? nxp b.v. 2013. all rights reserved. product data sheet rev. 1 ? 25 june 2013 3 of 20 nxp semiconductors blf8g20ls-400p(g)v power ldmos transistor 4. limiting values [1] continuous use at maximum temperature will affect the reliability. 5. thermal characteristics 6. characteristics table 4. limiting values in accordance with the absolute maximum rating system (iec 60134). symbol parameter conditions min max unit v ds drain-source voltage - 65 v v gs gate-source voltage ? 0.5 +13 v t stg storage temperature ? 65 +150 ?c t j junction temperature [1] - 225 ?c table 5. thermal characteristics symbol parameter conditions typ unit r th(j-c) thermal resistance from junction to case t case =80 ?c; p l = 80 w 0.23 k/w table 6. dc characteristics t j = 25 ? c; per section unless otherwise specified. symbol parameter conditions min typ max unit v (br)dss drain-source breakdown voltage v gs =0v; i d = 3.0 ma 65 - - v v gs(th) gate-source threshold voltage v ds = 10 v; i d = 300 ma 1.5 1.9 2.3 v i dss drain leakage current v gs =0v; v ds =28v - - 3.0 ? a i dsx drain cut-off current v gs =v gs(th) + 3.75 v; v ds =10v 51.5 - a i gss gate leakage current v gs =11 v; v ds = 0 v - - 300 na g fs forward transconductance v ds =10v; i d =15a - 20.6 - s r ds(on) drain-source on-state resistance v gs =v gs(th) + 3.75 v; i d = 10.5 a - 0.055 - ? table 7. rf characteristics test signal: 2-carrier w-cdma; par = 7.5 db at 0.01 % probability on the ccdf; 3gpp test model 1; 1-64 dpch; f 1 = 1807.5 mhz; f 2 = 1812.5 mhz; f 3 = 1872.5 mhz; f 4 = 1877.5 mhz; rf performance at v ds =28v; i dq = 3400 ma; t case =25 ? c; unless otherwise specified; in a class-ab production test circuit, tested on straight lead device. symbol parameter conditions min typ max unit g p power gain p l(av) =95w 17.8 19 - db rl in input return loss p l(av) =95w - ? 12 ? 6db ? d drain efficiency p l(av) =95w 24 28 - % acpr 5m adjacent channel power ratio (5 mhz) p l(av) =95w - ? 33 ? 28 dbc blf8g20ls-400pv_ls-400pgv all information provided in this document is subject to legal disclaimers. ? nxp b.v. 2013. all rights reserved. product data sheet rev. 1 ? 25 june 2013 4 of 20 nxp semiconductors blf8g20ls-400p(g)v power ldmos transistor 7. test information 7.1 ruggedness in class-ab operation the blf8g20ls-400pv and BLF8G20LS-400PGV are capable of withstanding a load mismatch corresponding to vswr = 10 : 1 through all phases under the following conditions: v ds =28v; i dq = 3300 ma; 2-carrier w-cdma signal; p l =200 w; f c = 1800 mhz; 5 mhz spacing, 46 % clipping. 7.2 impedance information [1] z s and z l defined in figure 1 . table 8. typical impedance for the top-half of the push-pull package measured load-pull data; i dq = 1800 ma; v ds = 28 v; t case = 25 ? c, water cooled. f z s [1] z l [1] (mhz) (? ) (? ) blf8g20ls-400pv (straight lead) 1800 4.1 ? j4.66 4.1 ? j4.5 1840 5.2 ? j3.6 4.4 ? j4.4 1880 4.6 ? j1.45 4.85 ? j4.25 1930 2.8 ? j0.3 4.5 ? j4.3 1960 2.1 ? j0.5 5.5 ? j3.5 1990 1.56 ? j0.6 5.5 ? j3.4 BLF8G20LS-400PGV (gull-wing) 1800 3.7 ? j7.6 4.2 ? j6.8 1840 4.34 ? j6.1 4.4 ? j6.7 1880 4.75 ? j5.2 4 ? j6.4 1930 3.17 ? j3.4 4.6 ? j6.5 1960 2 ? j3.05 5.8 ? j5.5 1990 2.5 ? j2.6 5.8 ? j5.7 fig 1. definition of transistor impedance 001aaf059 drain z l z s gate blf8g20ls-400pv_ls-400pgv all information provided in this document is subject to legal disclaimers. ? nxp b.v. 2013. all rights reserved. product data sheet rev. 1 ? 25 june 2013 5 of 20 nxp semiconductors blf8g20ls-400p(g)v power ldmos transistor 7.3 vbw in class-ab operation the blf8g20ls-400pv and BLF8G20LS-400PGV have a video bandwidth of 120 mhz (typical) when measured in a class-ab test circuit operating in the 1800 mhz to 1880 mhz frequency band for v ds = 28 v and i dq = 3.3 a, where the vbw is defined as the location of the resonance in the base-band impedance measurement obtained using a low-frequency probe. the vbw measurement based on the 2-tone imd test as a function of carrier spacing is shown below. (1) imd low (2) imd high fig 2. vbw capacity in a class-ab test circuit d d d f d u u l h u v s d f l q j 0 + ] , 0 ' , 0 ' , 0 ' g % f g % f g % f , 0 ' , 0 ' , 0 ' , 0 ' , 0 ' , 0 ' , 0 ' , 0 ' , 0 ' blf8g20ls-400pv_ls-400pgv all information provided in this document is subject to legal disclaimers. ? nxp b.v. 2013. all rights reserved. product data sheet rev. 1 ? 25 june 2013 6 of 20 nxp semiconductors blf8g20ls-400p(g)v power ldmos transistor 7.4 test circuit printed-circuit board (pcb): rogers 4350b; ? r = 3.66; thickness = 0.762 mm; thickness copper plating = 35 ? m. see table 9 for a list of components. fig 3. component layout table 9. list of components see figure 3 for component layout. component description value remarks c1, c5, c16, c20 multilayer ceramic chip capacitor 10 ? f, 50 v murata, smd 2220 c2, c6, c15, c19 multilayer ceramic chip capacitor 4.7 ? f, 50 v murata c3, c7, c14, c18 multilayer ceramic chip capacitor 1 nf atc100b c4, c8, c9, c10, c13, c17, c21 multilayer ceramic chip capacitor 24 pf atc100b c11, c12 multilayer ceramic chip capacitor 100 pf atc100b c22, c23 electroly tic capacitor 2200 ? f, 6 3 v r1, r2 resistor 10 ? smd 1206 r3, r5 resistor 5.1 ? smd 1206 r4 resistor 33 ? smd 1206 & |